LIT-4 Michelson Interferometer

Michelson Interferometer The Michelson interferometer is a fundamental instrument in physics laboratories. The platform design is used to facilitate the addition of the studied material to the optical path. It can observe equal inclination interference, equal thickness interference and white light interference, measure monochromatic light wavelength, sodium yellow double line wavelength difference, transparent dielectric slice and air refractive index. This equipment contains a Michelson interferometer on one square base, which is made of a thick steel plate with a rigid-frame. He-Ne laser as light source, it can also be changed to semiconductor laser. The Michelson interferometer is known for observing two-beam interference phenomena such as equal-inclination interference, equal-thickness interference, and white-light interference. It has been used for precise measurements of wavelengths, small-path distances, and refractive indices of transparent media. Experiment Examples  1. Interference fringe observation 2. Equal-inclination fringe observation 3. Equal-thickness fringe observation 4. White-light fringe observation 5. Wavelength measurement of Sodium D-lines 6. Wavelength separation measurement of Sodium D-lines 7. Measurement of the refractive index of air 8. Measurement of the refractive index of a transparent slice   Specifications  Item Specifications Flatness of Beam Splitter & Compensator ≤1/20λ Min Division Value of Micrometer 0.0005mm He-Ne Laser 0.7-1mW, 632.8nm Wavelength Measurement Accuracy Relative Error at 2% for 100 Fringes Tungsten-Sodium Lamp&Air gauge